File:ED-XRF.JPG
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ED-XRF
Photo Courtesy of Dr. Michael S. Krzemnicki, Director, Swiss Gemmological Institute
© Swiss Gemmological Institute SSEF
The ED-XRF, a non-destructive spectroscopic technique, uses an x-ray beam that illuminates the gemstone sample. This energy causes the material to emit x-rays and is used for:
- Trace metal and transition metal determination
- Determining chemical composition of a gemstone
- Detection for a number of gemstone enhancements
- Revealing whether staining or chemical impregnation has occurred in gemstones
- Differentiating freshwater from saltwater pearls
- Determining the origins of corundum and alexandrite
- Determining the geological environment in which stones were formed
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 10:15, 1 November 2009 | | 450 × 277 (20 KB) | Tim (talk | contribs) | ED-XRF Photo Courtesy of Dr. Michael S. Krzemnicki, Director, Swiss Gemmological Institute © Swiss Gemmological Institute SSEF <br /> The ED-XRF, a non-destructive spectroscopic technique, uses an x-ray beam that illuminates the gemstone sample. This e |
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